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Interferometer Controller "HORIZON"

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

This is a series of controllers designed to measure thickness and distance in conjunction with optical sensor heads. Utilizing interferometric (interferometer) technology and a dedicated data processing software package, it provides a solution for accurate measurements even in situations where contact with the target area is not possible. With high precision and stability at the sub-micron level, it guarantees reliable measurements with excellent repeatability and accuracy. Additionally, it supports inline process control with real-time monitoring, contributing to improved production efficiency.

  • Horizon_01_280x187.jpg
  • Coating thickness gauge

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